High frequency noise disturbance INS test
Test introduction
The high-frequency noise disturbance INS test is a test in the field of EMC. The basic test purpose is the same as the international standard IEC 61000-4-4 (electrical fast transient burst test). This testing capability mainly serves customers related to Japan and some Asian countries.
High frequency noise disturbance INS test
This test mainly simulates switching devices in the circuit, such as relays, etc. When they are turned on or off, the current in the circuit will change rapidly. If there are inductive components in the circuit, the rapid changes in current will cause instantaneous high-voltage interference. This type of interference contains a wide spectrum (up to 2GHz), is coupled, reflected, and resonates through the wiring of the power line and the printed circuit board inside the equipment, and is amplified by the IC, which may cause equipment failure. In order to ensure the stability of electronic products during use, it is necessary to conduct an anti-interference test (EMS) on them. Using a high-frequency pulse generator, several sets of pulse signals are directly applied to the sample under test to ensure that the sample before and after the test and during the test The change in performance is used to evaluate the anti-interference ability of the sample.
Test application object
Central control panel and other electronic equipment and instruments
Commonly used standards
NECA TR-28: Rectangular Wave High Frequency Noise Tester Test Pointer
JEM TR-177: Rectangular Wave High Frequency Noise Tester Test Guidelines for Electrical Machinery and Devices
JEC 0103_2005: Low voltage control loop test standard
test instrument
high frequency pulse generator
high frequency pulse generator
Model data:
Model: INS-40A
Output pulse amplitude (50Ω load): rectangular pulse 0~2KVmax±10%
Open circuit output pulse amplitude: rectangular pulse 0~4KVmax±10%
Pulse width: 50ns~1㎲ (50ns step at 50Ω load)
Rise time ≤1ns
Power supply capacity of the equipment under test:
AC single phase: 220Vmax, 16Amax
DC single phase: 220Vmax, 16Amax
Test Methods
1. Connect the pulse output end directly to the power input end of the sample under test using the output coaxial cable.
High frequency noise disturbance INS test method
2. Cooperate with the complete machine or the connecting substrate, and apply the pulse directly to a distance of 0cm from the sample shell through the near-field probe (electric field, magnetic field).
High frequency noise disturbance INS test
Test introduction
The high-frequency noise disturbance INS test is a test in the field of EMC. The basic test purpose is the same as the international standard IEC 61000-4-4 (electrical fast transient burst test). This testing capability mainly serves customers related to Japan and some Asian countries.
High frequency noise disturbance INS test
This test mainly simulates switching devices in the circuit, such as relays, etc. When they are turned on or off, the current in the circuit will change rapidly. If there are inductive components in the circuit, the rapid changes in current will cause instantaneous high-voltage interference. This type of interference contains a wide spectrum (up to 2GHz), is coupled, reflected, and resonates through the wiring of the power line and the printed circuit board inside the equipment, and is amplified by the IC, which may cause equipment failure. In order to ensure the stability of electronic products during use, it is necessary to conduct an anti-interference test (EMS) on them. Using a high-frequency pulse generator, several sets of pulse signals are directly applied to the sample under test to ensure that the sample before and after the test and during the test The change in performance is used to evaluate the anti-interference ability of the sample.
Test application object
Central control panel and other electronic equipment and instruments
Commonly used standards
NECA TR-28: Rectangular Wave High Frequency Noise Tester Test Pointer
JEM TR-177: Rectangular Wave High Frequency Noise Tester Test Guidelines for Electrical Machinery and Devices
JEC 0103_2005: Low voltage control loop test standard
test instrument
high frequency pulse generator
high frequency pulse generator
Model data:
Model: INS-40A
Output pulse amplitude (50Ω load): rectangular pulse 0~2KVmax±10%
Open circuit output pulse amplitude: rectangular pulse 0~4KVmax±10%
Pulse width: 50ns~1㎲ (50ns step at 50Ω load)
Rise time ≤1ns
Power supply capacity of the equipment under test:
AC single phase: 220Vmax, 16Amax
DC single phase: 220Vmax, 16Amax
Test Methods
1. Connect the pulse output end directly to the power input end of the sample under test using the output coaxial cable.
High frequency noise disturbance INS test method
2. Cooperate with the complete machine or the connecting substrate, and apply the pulse directly to a distance of 0cm from the sample shell through the near-field probe (electric field, magnetic field).