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Surface microscopic analysis

Surface microscopic analysis

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Product Description

Surface microscopic analysis
Surface microscopic analysis
Surface microscopic analysis is the use of microscopes, scanning electron microscopes, and transmission electron microscopes to observe the surface, fracture, and other sections of interest of the sample at high magnification. For example, surface morphology, fracture morphology, metallographic structure, microscopic layered structure, and other test items that require high-magnification observation.

Surface microscopic analysis laboratory

Application range
Electronic components, automotive electronics, medical, communications, mobile phones, computers, electrical, etc.
Function and significance
Through microscopic analysis of material morphology, engineers can effectively predict the performance of materials, so as to better judge the scope of application and safe service life of materials. Nowadays, with the continuous development of science and technology, the analysis methods of materials are also constantly improving and diversifying. Researchers can explore the microscopic world of materials through more sophisticated instruments and advanced technologies.
Application of surface microscopic analysis
1. Provide observation and analysis of surface and cross-sectional microstructures;
2. Provide accurate film thickness measurement and marking for multi-layer structure samples;
3. Passive image contrast (PVC) by low-energy electron beam scanning can accurately locate the damage of components with poor leakage or poor contact, and provide judgment of abnormal analysis;
4. Samples are provided with SEM to automatically shoot and stitch the circuit through layer removal technology (Delayers), and the image files generated can be vertically linked with the images generated by optical microscope, providing reference for circuit restoration reverse engineering.

Products Details

Home > Products >
Certification
>
Surface microscopic analysis

Surface microscopic analysis

Detail Information
Product Description

Surface microscopic analysis
Surface microscopic analysis
Surface microscopic analysis is the use of microscopes, scanning electron microscopes, and transmission electron microscopes to observe the surface, fracture, and other sections of interest of the sample at high magnification. For example, surface morphology, fracture morphology, metallographic structure, microscopic layered structure, and other test items that require high-magnification observation.

Surface microscopic analysis laboratory

Application range
Electronic components, automotive electronics, medical, communications, mobile phones, computers, electrical, etc.
Function and significance
Through microscopic analysis of material morphology, engineers can effectively predict the performance of materials, so as to better judge the scope of application and safe service life of materials. Nowadays, with the continuous development of science and technology, the analysis methods of materials are also constantly improving and diversifying. Researchers can explore the microscopic world of materials through more sophisticated instruments and advanced technologies.
Application of surface microscopic analysis
1. Provide observation and analysis of surface and cross-sectional microstructures;
2. Provide accurate film thickness measurement and marking for multi-layer structure samples;
3. Passive image contrast (PVC) by low-energy electron beam scanning can accurately locate the damage of components with poor leakage or poor contact, and provide judgment of abnormal analysis;
4. Samples are provided with SEM to automatically shoot and stitch the circuit through layer removal technology (Delayers), and the image files generated can be vertically linked with the images generated by optical microscope, providing reference for circuit restoration reverse engineering.